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Fabrication and characterization of fin SONOS flash memory ..:
Yun, Jang-Gn
;
Kim, Yoon
;
Park, Il Han
...
Solid-State Electronics. 52 (2008) 10 - p. 1498-1504 , 2008
Link:
https://doi.org/10.1016/j.sse.2008.06.021
RT Journal T1
Fabrication and characterization of fin SONOS flash memory with separated double-gate structure
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2008.06.021&Exemplar=1&LAN=DE A1 Yun, Jang-Gn A1 Kim, Yoon A1 Park, Il Han A1 Lee, Jung Hoon A1 Kang, Sangwoo A1 Lee, Dong-Hua A1 Cho, Seongjae A1 Kim, Doo-Hyun A1 Lee, Gil Sung A1 Sim, Won-Bo A1 Son, Younghwan A1 Shin, Hyungcheol A1 Lee, Jong Duk A1 Park, Byung-Gook PB Elsevier BV YR 2008 SN 0038-1101 JF Solid-State Electronics VO 52 IS 10 SP 1498 OP 1504 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2008.06.021 DO https://doi.org/10.1016/j.sse.2008.06.021 SF ELIB - SuUB Bremen
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