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Characterization of Al2O3–HfO2–Al2O3 sandwiched MIM capacit..:
Kwak, Ho-Young
;
Kwon, Hyuk-Min
;
Jung, Yi-Jung
...
Solid-State Electronics. 79 (2013) - p. 218-222 , 2013
Link:
https://doi.org/10.1016/j.sse.2012.09.007
RT Journal T1
Characterization of Al2O3–HfO2–Al2O3 sandwiched MIM capacitor under DC and AC stresses
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2012.09.007&Exemplar=1&LAN=DE A1 Kwak, Ho-Young A1 Kwon, Hyuk-Min A1 Jung, Yi-Jung A1 Kwon, Sung-Kyu A1 Jang, Jae-Hyung A1 Choi, Woon-Il A1 Ha, Man-Lyun A1 Lee, Ju-Il A1 Lee, Song-Jae A1 Lee, Hi-Deok PB Elsevier BV YR 2013 SN 0038-1101 JF Solid-State Electronics VO 79 SP 218 OP 222 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2012.09.007 DO https://doi.org/10.1016/j.sse.2012.09.007 SF ELIB - SuUB Bremen
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