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1 Ergebnisse
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The role of cold carriers and the multiple-carrier process ..:
Sharma, Prateek
;
Tyaginov, Stanislav
;
Jech, Markus
...
Solid-State Electronics. 115 (2016) - p. 185-191 , 2016
Link:
https://doi.org/10.1016/j.sse.2015.08.014
RT Journal T1
The role of cold carriers and the multiple-carrier process of Si–H bond dissociation for hot-carrier degradation in n- and p-channel LDMOS devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2015.08.014&Exemplar=1&LAN=DE A1 Sharma, Prateek A1 Tyaginov, Stanislav A1 Jech, Markus A1 Wimmer, Yannick A1 Rudolf, Florian A1 Enichlmair, Hubert A1 Park, Jong-Mun A1 Ceric, Hajdin A1 Grasser, Tibor PB Elsevier BV YR 2016 SN 0038-1101 JF Solid-State Electronics VO 115 SP 185 OP 191 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2015.08.014 DO https://doi.org/10.1016/j.sse.2015.08.014 SF ELIB - SuUB Bremen
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