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1 Ergebnisse
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A review of the mechanical stressors efficiency applied to ..:
Morin, Pierre
;
Maitrejean, Sylvain
;
Allibert, Frederic
...
Solid-State Electronics. 117 (2016) - p. 100-116 , 2016
Link:
https://doi.org/10.1016/j.sse.2015.11.024
RT Journal T1
A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2015.11.024&Exemplar=1&LAN=DE A1 Morin, Pierre A1 Maitrejean, Sylvain A1 Allibert, Frederic A1 Augendre, Emmanuel A1 Liu, Qing A1 Loubet, Nicolas A1 Grenouillet, Laurent A1 Pofelski, Alexandre A1 Chen, Kangguo A1 Khakifirooz, Ali A1 Wacquez, Romain A1 Reboh, Shay A1 Bonnevialle, Aurore A1 le Royer, Cyrille A1 Morand, Yves A1 Kanyandekwe, Joel A1 Chanemougamme, Daniel A1 Mignot, Yann A1 Escarabajal, Yann A1 Lherron, Benoit A1 Chafik, Fadoua A1 Pilorget, Sonia A1 Caubet, Pierre A1 Vinet, Maud A1 Clement, Laurent A1 Desalvo, Barbara A1 Doris, Bruce A1 Kleemeier, Walter PB Elsevier BV YR 2016 SN 0038-1101 JF Solid-State Electronics VO 117 SP 100 OP 116 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2015.11.024 DO https://doi.org/10.1016/j.sse.2015.11.024 SF ELIB - SuUB Bremen
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