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Post drain-stress behavior of AlGaN/GaN-on-Si MIS-HEMTs:
Jauss, Simon A.
;
Kilian, Stefan
;
Schwaiger, Stephan
...
Solid-State Electronics. 125 (2016) - p. 125-132 , 2016
Link:
https://doi.org/10.1016/j.sse.2016.07.014
RT Journal T1
Post drain-stress behavior of AlGaN/GaN-on-Si MIS-HEMTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2016.07.014&Exemplar=1&LAN=DE A1 Jauss, Simon A. A1 Kilian, Stefan A1 Schwaiger, Stephan A1 Noll, Stefan A1 Daves, Walter A1 Ambacher, Oliver PB Elsevier BV YR 2016 SN 0038-1101 JF Solid-State Electronics VO 125 SP 125 OP 132 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2016.07.014 DO https://doi.org/10.1016/j.sse.2016.07.014 SF ELIB - SuUB Bremen
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