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1 Ergebnisse
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Defect-creation effects on abnormal on-current under drain ..:
Ha, Tae-Kyoung
;
Kim, Yongjo
;
Cho, Yong-Jung
...
Solid-State Electronics. 165 (2020) - p. 107752 , 2020
Link:
https://doi.org/10.1016/j.sse.2019.107752
RT Journal T1
Defect-creation effects on abnormal on-current under drain bias illumination stress in a-IGZO thin-film transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2019.107752&Exemplar=1&LAN=DE A1 Ha, Tae-Kyoung A1 Kim, Yongjo A1 Cho, Yong-Jung A1 Kang, Yun-Seong A1 Yu, SangHee A1 Kim, GwangTae A1 Jeong, Hoon A1 Park, Jeong Ki A1 Kim, Ohyun PB Elsevier BV YR 2020 SN 0038-1101 JF Solid-State Electronics VO 165 SP 107752 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2019.107752 DO https://doi.org/10.1016/j.sse.2019.107752 SF ELIB - SuUB Bremen
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