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1 Ergebnisse
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Investigation of electrical characteristics of flexible CMO..:
Park, Honghwi
;
Lim, Changhee
;
Noh, Yeho
...
Solid-State Electronics. 173 (2020) - p. 107901 , 2020
Link:
https://doi.org/10.1016/j.sse.2020.107901
RT Journal T1
Investigation of electrical characteristics of flexible CMOS devices fabricated with thickness-controlled spalling process
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2020.107901&Exemplar=1&LAN=DE A1 Park, Honghwi A1 Lim, Changhee A1 Noh, Yeho A1 Lee, Chang-Ju A1 Won, Heungsup A1 Jung, Jaedong A1 Choi, Muhan A1 Kim, Jae-Joon A1 Yoo, Hocheon A1 Park, Hongsik PB Elsevier BV YR 2020 SN 0038-1101 JF Solid-State Electronics VO 173 SP 107901 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2020.107901 DO https://doi.org/10.1016/j.sse.2020.107901 SF ELIB - SuUB Bremen
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