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1 Ergebnisse
1
Back-gate effects on DC performance and carrier transport i..:
Han, Hung-Chi
;
Jazaeri, Farzan
;
D'Amico, Antonio
...
Solid-State Electronics. 193 (2022) - p. 108296 , 2022
Link:
https://doi.org/10.1016/j.sse.2022.108296
RT Journal T1
Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2022.108296&Exemplar=1&LAN=DE A1 Han, Hung-Chi A1 Jazaeri, Farzan A1 D'Amico, Antonio A1 Zhao, Zhixing A1 Lehmann, Steffen A1 Kretzschmar, Claudia A1 Charbon, Edoardo A1 Enz, Christian PB Elsevier BV YR 2022 SN 0038-1101 JF Solid-State Electronics VO 193 SP 108296 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2022.108296 DO https://doi.org/10.1016/j.sse.2022.108296 SF ELIB - SuUB Bremen
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