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Interpretation of 28 nm FD-SOI quantum dot transport data t..:
Kriekouki, Ioanna
;
Beaudoin, Félix
;
Philippopoulos, Pericles
...
Solid-State Electronics. 194 (2022) - p. 108355 , 2022
Link:
https://doi.org/10.1016/j.sse.2022.108355
RT Journal T1
Interpretation of 28 nm FD-SOI quantum dot transport data taken at 1.4 K using 3D quantum TCAD simulations
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2022.108355&Exemplar=1&LAN=DE A1 Kriekouki, Ioanna A1 Beaudoin, Félix A1 Philippopoulos, Pericles A1 Zhou, Chenyi A1 Camirand Lemyre, Julien A1 Rochette, Sophie A1 Mir, Salvador A1 Barragan, Manuel J. A1 Pioro-Ladrière, Michel A1 Galy, Philippe PB Elsevier BV YR 2022 SN 0038-1101 JF Solid-State Electronics VO 194 SP 108355 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2022.108355 DO https://doi.org/10.1016/j.sse.2022.108355 SF ELIB - SuUB Bremen
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