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1 Ergebnisse
1
Neural Network-Based prediction for Cross-Temperature induc..:
Cho, Kyeongrae
;
Park, Chanyang
;
Jang, Hyundong
...
Solid-State Electronics. 217 (2024) - p. 108925 , 2024
Link:
https://doi.org/10.1016/j.sse.2024.108925
RT Journal T1
Neural Network-Based prediction for Cross-Temperature induced VT distribution shift in 3D NAND flash memory
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2024.108925&Exemplar=1&LAN=DE A1 Cho, Kyeongrae A1 Park, Chanyang A1 Jang, Hyundong A1 Yun, Hyeok A1 Eom, Seungjoon A1 Sang Park, Min A1 Baek, Rock-Hyun PB Elsevier BV YR 2024 SN 0038-1101 JF Solid-State Electronics VO 217 SP 108925 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2024.108925 DO https://doi.org/10.1016/j.sse.2024.108925 SF ELIB - SuUB Bremen
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