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1 Ergebnisse
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Analysis of Mechanical Stress on Fowler-Nordheim Tunneling ..:
Kim, Donghyun
;
Nam, Kihoon
;
Park, Chanyang
...
Solid-State Electronics. 216 (2024) - p. 108927 , 2024
Link:
https://doi.org/10.1016/j.sse.2024.108927
RT Journal T1
Analysis of Mechanical Stress on Fowler-Nordheim Tunneling for Program Operation in 3D NAND Flash Memory
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sse.2024.108927&Exemplar=1&LAN=DE A1 Kim, Donghyun A1 Nam, Kihoon A1 Park, Chanyang A1 You, Hyunseo A1 Sang Park, Min A1 Kim, Yunsu A1 Park, Seongjo A1 Baek, Rock-Hyun PB Elsevier BV YR 2024 SN 0038-1101 JF Solid-State Electronics VO 216 SP 108927 LK http://dx.doi.org/https://doi.org/10.1016/j.sse.2024.108927 DO https://doi.org/10.1016/j.sse.2024.108927 SF ELIB - SuUB Bremen
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