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In-situ surface-sensitive X-ray diffraction study on the in..:
Renner, Frank Uwe
;
Ankah, Genesis Ngwa
;
Pareek, Aparna
Surface Science. 606 (2012) 9-10 - p. L37-L40 , 2012
Link:
https://doi.org/10.1016/j.susc.2012.01.013
RT Journal T1
In-situ surface-sensitive X-ray diffraction study on the influence of iodide over the selective electrochemical etching of Cu3Au (111)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.susc.2012.01.013&Exemplar=1&LAN=DE A1 Renner, Frank Uwe A1 Ankah, Genesis Ngwa A1 Pareek, Aparna PB Elsevier BV YR 2012 SN 0039-6028 JF Surface Science VO 606 IS 9-10 SP L37 OP L40 LK http://dx.doi.org/https://doi.org/10.1016/j.susc.2012.01.013 DO https://doi.org/10.1016/j.susc.2012.01.013 SF ELIB - SuUB Bremen
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