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1 Ergebnisse
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Stochastic technology life cycle analysis using multiple pa..:
Lee, Changyong
;
Kim, Juram
;
Kwon, Ohjin
.
Technological Forecasting and Social Change. 106 (2016) - p. 53-64 , 2016
Link:
https://doi.org/10.1016/j.techfore.2016.01.024
RT Journal T1
Stochastic technology life cycle analysis using multiple patent indicators
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.techfore.2016.01.024&Exemplar=1&LAN=DE A1 Lee, Changyong A1 Kim, Juram A1 Kwon, Ohjin A1 Woo, Han-Gyun PB Elsevier BV YR 2016 SN 0040-1625 JF Technological Forecasting and Social Change VO 106 SP 53 OP 64 LK http://dx.doi.org/https://doi.org/10.1016/j.techfore.2016.01.024 DO https://doi.org/10.1016/j.techfore.2016.01.024 SF ELIB - SuUB Bremen
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