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1 Ergebnisse
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Far-infrared magnetooptic generalized ellipsometry: determi..:
Schubert, Mathias
;
Hofmann, Tino
;
Herzinger, Craig M.
Thin Solid Films. 455-456 (2004) - p. 563-570 , 2004
Link:
https://doi.org/10.1016/j.tsf.2003.11.215
RT Journal T1
Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2003.11.215&Exemplar=1&LAN=DE A1 Schubert, Mathias A1 Hofmann, Tino A1 Herzinger, Craig M. PB Elsevier BV YR 2004 SN 0040-6090 JF Thin Solid Films VO 455-456 SP 563 OP 570 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2003.11.215 DO https://doi.org/10.1016/j.tsf.2003.11.215 SF ELIB - SuUB Bremen
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