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Structural study of amorphous In2O3 film by grazing inciden..:
Utsuno, Futoshi
;
Inoue, Hiroyuki
;
Yasui, Itaru
...
Thin Solid Films. 496 (2006) 1 - p. 95-98 , 2006
Link:
https://doi.org/10.1016/j.tsf.2005.08.256
RT Journal T1
Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2005.08.256&Exemplar=1&LAN=DE A1 Utsuno, Futoshi A1 Inoue, Hiroyuki A1 Yasui, Itaru A1 Shimane, Yukio A1 Tomai, Shigekazu A1 Matsuzaki, Shigeo A1 Inoue, Kazuyoshi A1 Hirosawa, Ichiro A1 Sato, Masugu A1 Honma, Tetsuo PB Elsevier BV YR 2006 SN 0040-6090 JF Thin Solid Films VO 496 IS 1 SP 95 OP 98 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2005.08.256 DO https://doi.org/10.1016/j.tsf.2005.08.256 SF ELIB - SuUB Bremen
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