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Capacitance profiling in the CIGS solar cells:
Ćwil, Michał
;
Igalson, Małgorzata
;
Zabierowski, Paweł
..
Thin Solid Films. 515 (2007) 15 - p. 6229-6232 , 2007
Link:
https://doi.org/10.1016/j.tsf.2006.12.102
RT Journal T1
Capacitance profiling in the CIGS solar cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2006.12.102&Exemplar=1&LAN=DE A1 Ćwil, Michał A1 Igalson, Małgorzata A1 Zabierowski, Paweł A1 Kaufmann, Chrystian A. A1 Neisser, Axel PB Elsevier BV YR 2007 SN 0040-6090 JF Thin Solid Films VO 515 IS 15 SP 6229 OP 6232 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2006.12.102 DO https://doi.org/10.1016/j.tsf.2006.12.102 SF ELIB - SuUB Bremen
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