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Electronic structural analysis of transparent In2O3–ZnO fil..:
Shibuya, Tadao
;
Yoshinaka, Masahiro
;
Shimane, Yukio
...
Thin Solid Films. 518 (2010) 11 - p. 3008-3011 , 2010
Link:
https://doi.org/10.1016/j.tsf.2009.09.170
RT Journal T1
Electronic structural analysis of transparent In2O3–ZnO films by hard X-ray photoelectron spectroscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2009.09.170&Exemplar=1&LAN=DE A1 Shibuya, Tadao A1 Yoshinaka, Masahiro A1 Shimane, Yukio A1 Utsuno, Futoshi A1 Yano, Koki A1 Inoue, Kazuyoshi A1 Ikenagab, Eiji A1 Kim, Jung J. A1 Ueda, Shigenori A1 Obata, Masaaki A1 Kobayashi, Keisuke PB Elsevier BV YR 2010 SN 0040-6090 JF Thin Solid Films VO 518 IS 11 SP 3008 OP 3011 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2009.09.170 DO https://doi.org/10.1016/j.tsf.2009.09.170 SF ELIB - SuUB Bremen
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