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On the modeling of ellipsometry data at large angles of inc..:
Foo, Yishu
;
Cheung, King Tai
;
To, Chap Hang
.
Thin Solid Films. 571 (2014) - p. 669-674 , 2014
Link:
https://doi.org/10.1016/j.tsf.2014.05.027
RT Journal T1
On the modeling of ellipsometry data at large angles of incidence using finite-difference time-domain
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2014.05.027&Exemplar=1&LAN=DE A1 Foo, Yishu A1 Cheung, King Tai A1 To, Chap Hang A1 Zapien, Juan Antonio PB Elsevier BV YR 2014 SN 0040-6090 JF Thin Solid Films VO 571 SP 669 OP 674 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2014.05.027 DO https://doi.org/10.1016/j.tsf.2014.05.027 SF ELIB - SuUB Bremen
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