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1 Ergebnisse
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Structural characterization of AlN thin films grown on sapp..:
Li, Wangwang
;
Xue, Weibiao
Thin Solid Films. 773 (2023) - p. 139826 , 2023
Link:
https://doi.org/10.1016/j.tsf.2023.139826
RT Journal T1
Structural characterization of AlN thin films grown on sapphire by atomic layer deposition
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2023.139826&Exemplar=1&LAN=DE A1 Li, Wangwang A1 Xue, Weibiao PB Elsevier BV YR 2023 SN 0040-6090 JF Thin Solid Films VO 773 SP 139826 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2023.139826 DO https://doi.org/10.1016/j.tsf.2023.139826 SF ELIB - SuUB Bremen
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