I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Precise quantification of the adhesion between metallic thi..:
Zhang, Zhifu
;
Wang, Chenyang
;
Wang, Xiaodong
...
Thin Solid Films. 784 (2023) - p. 140081 , 2023
Link:
https://doi.org/10.1016/j.tsf.2023.140081
RT Journal T1
Precise quantification of the adhesion between metallic thin films and silicon wafer
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.tsf.2023.140081&Exemplar=1&LAN=DE A1 Zhang, Zhifu A1 Wang, Chenyang A1 Wang, Xiaodong A1 Reddy, Kolan Madhav A1 Liu, Pan A1 Wang, Yang A1 Song, Shuangxi PB Elsevier BV YR 2023 SN 0040-6090 JF Thin Solid Films VO 784 SP 140081 LK http://dx.doi.org/https://doi.org/10.1016/j.tsf.2023.140081 DO https://doi.org/10.1016/j.tsf.2023.140081 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)