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Convergent beam electron diffraction of multilayer Van der ..:
Latychevskaia, Tatiana
;
Woods, Colin Robert
;
Wang, Yi Bo
...
Ultramicroscopy. 212 (2020) - p. 112976 , 2020
Link:
https://doi.org/10.1016/j.ultramic.2020.112976
RT Journal T1
Convergent beam electron diffraction of multilayer Van der Waals structures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ultramic.2020.112976&Exemplar=1&LAN=DE A1 Latychevskaia, Tatiana A1 Woods, Colin Robert A1 Wang, Yi Bo A1 Holwill, Matthew A1 Prestat, Eric A1 Haigh, Sarah J. A1 Novoselov, Kostya S. PB Elsevier BV YR 2020 SN 0304-3991 JF Ultramicroscopy VO 212 SP 112976 LK http://dx.doi.org/https://doi.org/10.1016/j.ultramic.2020.112976 DO https://doi.org/10.1016/j.ultramic.2020.112976 SF ELIB - SuUB Bremen
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