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1 Ergebnisse
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Resistivity contrast imaging in semiconductor structures us..:
Jóźwik, Iwona
;
Jagielski, Jacek
;
Dumiszewska, Ewa
..
Ultramicroscopy. 228 (2021) - p. 113333 , 2021
Link:
https://doi.org/10.1016/j.ultramic.2021.113333
RT Journal T1
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ultramic.2021.113333&Exemplar=1&LAN=DE A1 Jóźwik, Iwona A1 Jagielski, Jacek A1 Dumiszewska, Ewa A1 Kamiński, Maciej A1 Kentsch, Ulrich PB Elsevier BV YR 2021 SN 0304-3991 JF Ultramicroscopy VO 228 SP 113333 LK http://dx.doi.org/https://doi.org/10.1016/j.ultramic.2021.113333 DO https://doi.org/10.1016/j.ultramic.2021.113333 SF ELIB - SuUB Bremen
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