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An ion beam spot size monitor based on a nano-machined Si p..:
Andrini, G.
;
Nieto Hernández, E.
;
Provatas, G.
...
Vacuum. 205 (2022) - p. 111392 , 2022
Link:
https://doi.org/10.1016/j.vacuum.2022.111392
RT Journal T1
An ion beam spot size monitor based on a nano-machined Si photodiode probed by means of the ion beam induced charge technique
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.vacuum.2022.111392&Exemplar=1&LAN=DE A1 Andrini, G. A1 Nieto Hernández, E. A1 Provatas, G. A1 Brajkovic, M. A1 Crnjac, A. A1 Tchernij, S. Ditalia A1 Forneris, J. A1 Rigato, V. A1 Campostrini, M. A1 Siketic, Z. A1 Jaksic, M. A1 Vittone, E. PB Elsevier BV YR 2022 SN 0042-207X JF Vacuum VO 205 SP 111392 LK http://dx.doi.org/https://doi.org/10.1016/j.vacuum.2022.111392 DO https://doi.org/10.1016/j.vacuum.2022.111392 SF ELIB - SuUB Bremen
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