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1 Ergebnisse
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Deconvolution of high-resolution depth profiling data with ..:
Xu, Yingxuan
;
Liu, Gongwen
;
Li, Haiming
...
Vacuum. 227 (2024) - p. 113391 , 2024
Link:
https://doi.org/10.1016/j.vacuum.2024.113391
RT Journal T1
Deconvolution of high-resolution depth profiling data with sputtering induced roughness for reconstruction of nano-layer structure
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.vacuum.2024.113391&Exemplar=1&LAN=DE A1 Xu, Yingxuan A1 Liu, Gongwen A1 Li, Haiming A1 Wang, Jiangyong A1 Lian, Songyou A1 Xu, Rongwang PB Elsevier BV YR 2024 SN 0042-207X JF Vacuum VO 227 SP 113391 LK http://dx.doi.org/https://doi.org/10.1016/j.vacuum.2024.113391 DO https://doi.org/10.1016/j.vacuum.2024.113391 SF ELIB - SuUB Bremen
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