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Investigation of durability of Cr-p+a-Si:H–V film memory de..:
Hu, J
;
Snell, A.J
;
Hajto, J
..
Journal of Non-Crystalline Solids. 266-269 (2000) - p. 1054-1057 , 2000
Link:
https://doi.org/10.1016/s0022-3093(00)00024-7
RT Journal T1 <Title>Investigation of durability of Cr-p+a-Si:H–V film memory devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0022-3093(00)00024-7&Exemplar=1&LAN=DE A1 Hu, J A1 Snell, A.J A1 Hajto, J A1 Rose, M.J A1 Edmiston, W PB Elsevier BV YR 2000 SN 0022-3093 JF Journal of Non-Crystalline Solids VO 266-269 SP 1054 OP 1057 LK http://dx.doi.org/https://doi.org/10.1016/s0022-3093(00)00024-7 DO https://doi.org/10.1016/s0022-3093(00)00024-7 SF ELIB - SuUB Bremen
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