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New approaches in the transient thermal measurements:
Székely, V
;
Ress, S
;
Poppe, A
...
Microelectronics Journal. 31 (2000) 9-10 - p. 727-733 , 2000
Link:
https://doi.org/10.1016/s0026-2692(00)00051-3
RT Journal T1 <Title>New approaches in the transient thermal measurements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0026-2692(00)00051-3&Exemplar=1&LAN=DE A1 Székely, V A1 Ress, S A1 Poppe, A A1 Török, S A1 Magyari, D A1 Benedek, Zs A1 Torki, K A1 Courtois, B A1 Rencz, M PB Elsevier BV YR 2000 SN 0026-2692 JF Microelectronics Journal VO 31 IS 9-10 SP 727 OP 733 LK http://dx.doi.org/https://doi.org/10.1016/s0026-2692(00)00051-3 DO https://doi.org/10.1016/s0026-2692(00)00051-3 SF ELIB - SuUB Bremen
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