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1 Ergebnisse
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Electrical analysis of DRAM cell transistors for the root-c..:
Pil Kim, Young
;
Chung, Uin
;
Tae Moon, Joo
.
Microelectronics Reliability. 43 (2003) 9-11 - p. 1461-1464 , 2003
Link:
https://doi.org/10.1016/s0026-2714(03)00259-2
RT Journal T1
Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0026-2714(03)00259-2&Exemplar=1&LAN=DE A1 Pil Kim, Young A1 Chung, Uin A1 Tae Moon, Joo A1 Kim, Sang U. PB Elsevier BV YR 2003 SN 0026-2714 JF Microelectronics Reliability VO 43 IS 9-11 SP 1461 OP 1464 LK http://dx.doi.org/https://doi.org/10.1016/s0026-2714(03)00259-2 DO https://doi.org/10.1016/s0026-2714(03)00259-2 SF ELIB - SuUB Bremen
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