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Investigation into socketed CDM (SDM) tester parasitics:
Chaine, M
;
Verhaege, K
;
Avery, L
...
Microelectronics Reliability. 39 (1999) 11 - p. 1531-1540 , 1999
Link:
https://doi.org/10.1016/s0026-2714(99)00081-5
RT Journal T1 <Title>Investigation into socketed CDM (SDM) tester parasitics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0026-2714(99)00081-5&Exemplar=1&LAN=DE A1 Chaine, M A1 Verhaege, K A1 Avery, L A1 Kelly, M A1 Gieser, H A1 Bock, K A1 Henry, L.G A1 Meuse, T A1 Brodbeck, T A1 Barth, J PB Elsevier BV YR 1999 SN 0026-2714 JF Microelectronics Reliability VO 39 IS 11 SP 1531 OP 1540 LK http://dx.doi.org/https://doi.org/10.1016/s0026-2714(99)00081-5 DO https://doi.org/10.1016/s0026-2714(99)00081-5 SF ELIB - SuUB Bremen
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