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Voids in silicon power devices:
Raineri, V.
;
Saggio, M.
;
Frisina, F.
.
Solid-State Electronics. 42 (1998) 12 - p. 2295-2301 , 1998
Link:
https://doi.org/10.1016/s0038-1101(98)00228-7
RT Journal T1 <Title>Voids in silicon power devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0038-1101(98)00228-7&Exemplar=1&LAN=DE A1 Raineri, V. A1 Saggio, M. A1 Frisina, F. A1 Rimini, E. PB Elsevier BV YR 1998 SN 0038-1101 JF Solid-State Electronics VO 42 IS 12 SP 2295 OP 2301 LK http://dx.doi.org/https://doi.org/10.1016/s0038-1101(98)00228-7 DO https://doi.org/10.1016/s0038-1101(98)00228-7 SF ELIB - SuUB Bremen
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