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The effects of oxygen content in Ti/Si layer systems on MCs..:
Dümmler, W
;
Weber, S
;
Tête, C
.
International Journal of Mass Spectrometry and Ion Processes. 164 (1997) 1-2 - p. 155-159 , 1997
Link:
https://doi.org/10.1016/s0168-1176(97)00054-2
RT Journal T1 <Title>The effects of oxygen content in Ti/Si layer systems on MCs+ SIMS analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0168-1176(97)00054-2&Exemplar=1&LAN=DE A1 Dümmler, W A1 Weber, S A1 Tête, C A1 Scherrer, S PB Elsevier BV YR 1997 SN 0168-1176 JF International Journal of Mass Spectrometry and Ion Processes VO 164 IS 1-2 SP 155 OP 159 LK http://dx.doi.org/https://doi.org/10.1016/s0168-1176(97)00054-2 DO https://doi.org/10.1016/s0168-1176(97)00054-2 SF ELIB - SuUB Bremen
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