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Electromigration in integrated circuit interconnects studie..:

Schneider, G. ; Denbeaux, G. ; Anderson, E....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  199 (2003)  - p. 469-474 , 2003
Link: https://doi.org/10.1016/s0168-583x(02)01565-3