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A scanning positron microscope for defect analysis in mater..:

Triftshäuser, W. ; Kögel, G. ; Sperr, P....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  130 (1997)  1-4 - p. 264-269 , 1997
Link: https://doi.org/10.1016/s0168-583x(97)00174-2