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New evidence of dominant processing effects in standard and..:
CANDELORI, A
;
RANDO, R
;
BISELLO, D
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 512 (2003) 1-2 - p. 52-59 , 2003
Link:
https://doi.org/10.1016/s0168-9002(03)01876-x
RT Journal T1 <Title>New evidence of dominant processing effects in standard and oxygenated silicon diodes after neutron irradiation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0168-9002(03)01876-x&Exemplar=1&LAN=DE A1 CANDELORI, A A1 RANDO, R A1 BISELLO, D A1 CAMPABADAL, F A1 CINDRO, V A1 FONSECA, L A1 KAMINSKI, A A1 LITOVCHENKO, A A1 LOZANO, M A1 MARTINEZ, C PB Elsevier BV YR 2003 SN 0168-9002 JF Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment VO 512 IS 1-2 SP 52 OP 59 LK http://dx.doi.org/https://doi.org/10.1016/s0168-9002(03)01876-x DO https://doi.org/10.1016/s0168-9002(03)01876-x SF ELIB - SuUB Bremen
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