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Investigation of damage-induced defects in silicon by TCT:

Fretwurst, E ; Eremin, V ; Feick, H...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  388 (1997)  3 - p. 356-360 , 1997
Link: https://doi.org/10.1016/s0168-9002(97)00002-8