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Comparing the resolution of magnetic force microscopes usin..:
Abelmann, Leon
;
Porthun, Steffen
;
Haast, Marc
...
Journal of Magnetism and Magnetic Materials. 190 (1998) 1-2 - p. 135-147 , 1998
Link:
https://doi.org/10.1016/s0304-8853(98)00281-9
RT Journal T1 <Title>Comparing the resolution of magnetic force microscopes using the CAMST reference samples</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0304-8853(98)00281-9&Exemplar=1&LAN=DE A1 Abelmann, Leon A1 Porthun, Steffen A1 Haast, Marc A1 Lodder, Cock A1 Moser, Andreas A1 Best, Margaret E A1 van Schendel, Pieter J.A A1 Stiefel, Bruno A1 Hug, Hans J A1 Heydon, Greg P A1 Farley, Andrew A1 Hoon, Steve R A1 Pfaffelhuber, Thomas A1 Proksch, Roger A1 Babcock, Ken PB Elsevier BV YR 1998 SN 0304-8853 JF Journal of Magnetism and Magnetic Materials VO 190 IS 1-2 SP 135 OP 147 LK http://dx.doi.org/https://doi.org/10.1016/s0304-8853(98)00281-9 DO https://doi.org/10.1016/s0304-8853(98)00281-9 SF ELIB - SuUB Bremen
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