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Analysis of Ni on Si-wafer surfaces using synchrotron radia..:

Wobrauschek, P. ; Görgl, R. ; Kregsamer, P....
Spectrochimica Acta Part B: Atomic Spectroscopy.  52 (1997)  7 - p. 901-906 , 1997
Link: https://doi.org/10.1016/s0584-8547(96)01674-6