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An inverse estimation scheme to measure steady-state tool–c..:
Kwon, P
;
Schiemann, T
;
Kountanya, R
International Journal of Machine Tools and Manufacture. 41 (2001) 7 - p. 1015-1030 , 2001
Link:
https://doi.org/10.1016/s0890-6955(00)00113-9
RT Journal T1 <Title>An inverse estimation scheme to measure steady-state tool–chip interface temperatures using an infrared camera</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0890-6955(00)00113-9&Exemplar=1&LAN=DE A1 Kwon, P A1 Schiemann, T A1 Kountanya, R PB Elsevier BV YR 2001 SN 0890-6955 JF International Journal of Machine Tools and Manufacture VO 41 IS 7 SP 1015 OP 1030 LK http://dx.doi.org/https://doi.org/10.1016/s0890-6955(00)00113-9 DO https://doi.org/10.1016/s0890-6955(00)00113-9 SF ELIB - SuUB Bremen
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