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X-ray reflectivity study of formation of multilayer porous ..:
Fenollosa, R
;
You, H
;
Chu, Y
.
Materials Science and Engineering: A. 288 (2000) 2 - p. 235-238 , 2000
Link:
https://doi.org/10.1016/s0921-5093(00)00848-0
RT Journal T1 <Title>X-ray reflectivity study of formation of multilayer porous anodic oxides of silicon</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0921-5093(00)00848-0&Exemplar=1&LAN=DE A1 Fenollosa, R A1 You, H A1 Chu, Y A1 Parkhutik, V PB Elsevier BV YR 2000 SN 0921-5093 JF Materials Science and Engineering: A VO 288 IS 2 SP 235 OP 238 LK http://dx.doi.org/https://doi.org/10.1016/s0921-5093(00)00848-0 DO https://doi.org/10.1016/s0921-5093(00)00848-0 SF ELIB - SuUB Bremen
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