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Study on the I–V characteristics of ferroelectric thin film..:
Jun, Yu
;
Xiaoming, Dong
;
Wenli, Zhou
...
Materials Science and Engineering: B. 76 (2000) 1 - p. 22-25 , 2000
Link:
https://doi.org/10.1016/s0921-5107(00)00408-6
RT Journal T1
Study on the I–V characteristics of ferroelectric thin film systems with the structure of MFSM
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0921-5107(00)00408-6&Exemplar=1&LAN=DE A1 Jun, Yu A1 Xiaoming, Dong A1 Wenli, Zhou A1 Yunbo, Wang A1 Yuankai, Zheng A1 Hua, Wang A1 Gang, Liu A1 Jifan, Xie A1 Junxiong, Gao PB Elsevier BV YR 2000 SN 0921-5107 JF Materials Science and Engineering: B VO 76 IS 1 SP 22 OP 25 LK http://dx.doi.org/https://doi.org/10.1016/s0921-5107(00)00408-6 DO https://doi.org/10.1016/s0921-5107(00)00408-6 SF ELIB - SuUB Bremen
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