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1 Ergebnisse
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Characterisation of InGaAs/InP microscopic Hall probe array..:
Cambel, V
;
Gregušová, D
;
Eliáš, P
...
Materials Science and Engineering: B. 51 (1998) 1-3 - p. 188-191 , 1998
Link:
https://doi.org/10.1016/s0921-5107(97)00257-2
RT Journal T1 <Title>Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0921-5107(97)00257-2&Exemplar=1&LAN=DE A1 Cambel, V A1 Gregušová, D A1 Eliáš, P A1 Hasenöhrl, S A1 Olejnı́ková, B A1 Novák, J A1 Schäpers, T A1 Neurohr, K A1 Fox, A PB Elsevier BV YR 1998 SN 0921-5107 JF Materials Science and Engineering: B VO 51 IS 1-3 SP 188 OP 191 LK http://dx.doi.org/https://doi.org/10.1016/s0921-5107(97)00257-2 DO https://doi.org/10.1016/s0921-5107(97)00257-2 SF ELIB - SuUB Bremen
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