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Atomic force microscope for planetary applications:
Akiyama, T.
;
Gautsch, S.
;
de Rooij, N.F.
...
Sensors and Actuators A: Physical. 91 (2001) 3 - p. 321-325 , 2001
Link:
https://doi.org/10.1016/s0924-4247(01)00602-1
RT Journal T1 <Title>Atomic force microscope for planetary applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0924-4247(01)00602-1&Exemplar=1&LAN=DE A1 Akiyama, T. A1 Gautsch, S. A1 de Rooij, N.F. A1 Staufer, U. A1 Niedermann, Ph. A1 Howald, L. A1 Müller, D. A1 Tonin, A. A1 Hidber, H.-R. A1 Pike, W.T. A1 Hecht, M.H. PB Elsevier BV YR 2001 SN 0924-4247 JF Sensors and Actuators A: Physical VO 91 IS 3 SP 321 OP 325 LK http://dx.doi.org/https://doi.org/10.1016/s0924-4247(01)00602-1 DO https://doi.org/10.1016/s0924-4247(01)00602-1 SF ELIB - SuUB Bremen
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