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Kelvin probe measurements of microcrystalline silicon on a ..:
Breymesser, A
;
Schlosser, V
;
Peiró, D
...
Solar Energy Materials and Solar Cells. 66 (2001) 1-4 - p. 171-177 , 2001
Link:
https://doi.org/10.1016/s0927-0248(00)00170-7
RT Journal T1 <Title>Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s0927-0248(00)00170-7&Exemplar=1&LAN=DE A1 Breymesser, A A1 Schlosser, V A1 Peiró, D A1 Voz, C A1 Bertomeu, J A1 Andreu, J A1 Summhammer, J PB Elsevier BV YR 2001 SN 0927-0248 JF Solar Energy Materials and Solar Cells VO 66 IS 1-4 SP 171 OP 177 LK http://dx.doi.org/https://doi.org/10.1016/s0927-0248(00)00170-7 DO https://doi.org/10.1016/s0927-0248(00)00170-7 SF ELIB - SuUB Bremen
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