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Bayesian synthetic evaluation of multistage reliability gro..:
Zhiqiang, Yan
;
Xinxin, Li
;
Hongwei, Xie
.
Journal of Systems Engineering and Electronics. 19 (2008) 6 - p. 1287-1294 , 2008
Link:
https://doi.org/10.1016/s1004-4132(08)60232-7
RT Journal T1 <Title>Bayesian synthetic evaluation of multistage reliability growth with instant and delayed fix modes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_s1004-4132(08)60232-7&Exemplar=1&LAN=DE A1 Zhiqiang, Yan A1 Xinxin, Li A1 Hongwei, Xie A1 Yingjie, Jiang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2008 SN 1004-4132 JF Journal of Systems Engineering and Electronics VO 19 IS 6 SP 1287 OP 1294 LK http://dx.doi.org/https://doi.org/10.1016/s1004-4132(08)60232-7 DO https://doi.org/10.1016/s1004-4132(08)60232-7 SF ELIB - SuUB Bremen
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