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Digital Field Ion Microscopy:
Sijbrandij, S. J.
;
Russell, K. F.
;
Thomson, R. C.
.
Microscopy and Microanalysis. 4 (1998) S2 - p. 88-89 , 1998
Link:
https://doi.org/10.1017/s1431927600020560
RT Journal T1 <Title>Digital Field Ion Microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927600020560&Exemplar=1&LAN=DE A1 Sijbrandij, S. J. A1 Russell, K. F. A1 Thomson, R. C. A1 Miller, M. K. PB Oxford University Press (OUP) YR 1998 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 4 IS S2 SP 88 OP 89 LK http://dx.doi.org/https://doi.org/10.1017/s1431927600020560 DO https://doi.org/10.1017/s1431927600020560 SF ELIB - SuUB Bremen
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