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Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical..:
Schnieders, A
Microscopy and Microanalysis. 12 (2006) S02 - p. 120-121 , 2006
Link:
https://doi.org/10.1017/s143192760606449x
RT Journal T1 <Title>Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s143192760606449x&Exemplar=1&LAN=DE A1 Schnieders, A PB Oxford University Press (OUP) YR 2006 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 12 IS S02 SP 120 OP 121 LK http://dx.doi.org/https://doi.org/10.1017/s143192760606449x DO https://doi.org/10.1017/s143192760606449x SF ELIB - SuUB Bremen
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