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Measurement of k-value in Semiconductor Structures:
Potapov, PL
;
Engelmann, H-J
;
Zschech, E
Microscopy and Microanalysis. 12 (2006) S02 - p. 1176-1177 , 2006
Link:
https://doi.org/10.1017/s1431927606069868
RT Journal T1 <Title>Measurement of k-value in Semiconductor Structures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927606069868&Exemplar=1&LAN=DE A1 Potapov, PL A1 Engelmann, H-J A1 Zschech, E PB Oxford University Press (OUP) YR 2006 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 12 IS S02 SP 1176 OP 1177 LK http://dx.doi.org/https://doi.org/10.1017/s1431927606069868 DO https://doi.org/10.1017/s1431927606069868 SF ELIB - SuUB Bremen
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