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Electron Tomographic Characterization of Er doped SiC:
Leschner, J
;
Kaiser, U
;
Biskupek, J
..
Microscopy and Microanalysis. 13 (2007) S03 - p. 116-117 , 2007
Link:
https://doi.org/10.1017/s1431927607080580
RT Journal T1 <Title>Electron Tomographic Characterization of Er doped SiC</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927607080580&Exemplar=1&LAN=DE A1 Leschner, J A1 Kaiser, U A1 Biskupek, J A1 Chuvilin, A A1 Kübel, Ch PB Oxford University Press (OUP) YR 2007 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 13 IS S03 SP 116 OP 117 LK http://dx.doi.org/https://doi.org/10.1017/s1431927607080580 DO https://doi.org/10.1017/s1431927607080580 SF ELIB - SuUB Bremen
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