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Silicon Based Electron, Optical and X-ray Imagers:
Rehak, P
Microscopy and Microanalysis. 15 (2009) S2 - p. 200-201 , 2009
Link:
https://doi.org/10.1017/s1431927609095701
RT Journal T1 <Title>Silicon Based Electron, Optical and X-ray Imagers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927609095701&Exemplar=1&LAN=DE A1 Rehak, P PB Oxford University Press (OUP) YR 2009 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 15 IS S2 SP 200 OP 201 LK http://dx.doi.org/https://doi.org/10.1017/s1431927609095701 DO https://doi.org/10.1017/s1431927609095701 SF ELIB - SuUB Bremen
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