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1 Ergebnisse
1
In-Situ Observation and Characterization of Structural Evol..:
Cha, D
;
Park, SY
;
Ahn, SJ
...
Microscopy and Microanalysis. 15 (2009) S2 - p. 716-717 , 2009
Link:
https://doi.org/10.1017/s1431927609097694
RT Journal T1 <Title>In-Situ Observation and Characterization of Structural Evolution in a Phase-Change Memory Device by TEM-STM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927609097694&Exemplar=1&LAN=DE A1 Cha, D A1 Park, SY A1 Ahn, SJ A1 Horii, H A1 Kim, DK A1 Kim, YK A1 Park, SO A1 Jung, UI A1 Kim, MJ A1 Kim, J PB Oxford University Press (OUP) YR 2009 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 15 IS S2 SP 716 OP 717 LK http://dx.doi.org/https://doi.org/10.1017/s1431927609097694 DO https://doi.org/10.1017/s1431927609097694 SF ELIB - SuUB Bremen
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