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Sensitivity And Quantitativity In Atom Probe Tomography:
Danoix, F
;
Bostel, A
;
Leitner, A
...
Microscopy and Microanalysis. 15 (2009) S2 - p. 258-259 , 2009
Link:
https://doi.org/10.1017/s1431927609098195
RT Journal T1 <Title>Sensitivity And Quantitativity In Atom Probe Tomography</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1017_s1431927609098195&Exemplar=1&LAN=DE A1 Danoix, F A1 Bostel, A A1 Leitner, A A1 Jessner, P A1 Sauvage, X A1 Gouné, M A1 Danoix, R PB Oxford University Press (OUP) YR 2009 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 15 IS S2 SP 258 OP 259 LK http://dx.doi.org/https://doi.org/10.1017/s1431927609098195 DO https://doi.org/10.1017/s1431927609098195 SF ELIB - SuUB Bremen
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